According to the m1l - std - 883c standard of thermal cycle loading , the delamination propagation rates at the interface between chip and underfill were studied experimentally by using c - mode scanning acoustic microscope ( c - sam ) for two types of flip chip packages with different states of solder joint 采用mil - std - 883c標準,通過溫度循環實驗,使用高頻超聲顯微鏡( c - sam )無損檢測技術,測量了在不同焊點狀態下, b型和d型兩種實際倒裝焊封裝芯片與底充膠界面分層裂縫傳播速率。